- C.J. Ditchman, D.W. Diehl, C.T. Cotton, N.E. Burdick, D. Woodlock, J. Zou, “Advances in freeform optical metrology using a multibeam low-coherence optical probe (Quad-Probe),” Proc. SPIE 8016 (2011).
- D.W. Diehl, C.T. Cotton, C.J. Ditchman, N.E. Burdick, H.S. Ammenheuser, “Multi-point low-coherence optical probe for freeform optical metrology,” OSA Optical Fabrication and Testing OTuD3 (2010).
- D.W. Diehl, C. Cotton, C.J. Ditchman, “Low-coherence surface metrology using a multiple-beam optical probe,” Proc. SPIE 7302 OT (2009).
- D.W. Diehl, C. Cotton, C.J. Ditchman, B. Statt, “Transmitted wavefront metrology of hemispheric domes using scanning low-coherence dual-interferometry (SLCDI),” Proc. SPIE 6545 ON (2007).
- D.W. Diehl, R.W. Schoonover, T.D. Visser, “The structure of focused, radially polarized fields,” Opt. Ex. 14, 3030–3038 (2006).
- D.W. Diehl, T.D. Visser, “Phase singularities of the longitudinal field components in the focal region of a high-aperture optical system,” JOSA A 21, 2103–2108 (2004).
- D.W. Diehl, N. George, “Analysis of multitone holographic interference filters by use of a sparse Hill Matrix method,” Appl. Opt. 43, 88–96 (2004).
- D.W. Diehl, N. George, “Holographic interference filters for infrared communications,” Appl. Opt. 42, 1203–1210 (2003).